Enjoy complimentary customisation on priority with our Enterprise License!
The e-beam wafer inspection system market share is expected to increase by USD 1.16 billion from 2020 to 2025, and the market's growth momentum will accelerate at a CAGR of 24.73%.
This e-beam wafer inspection system market research report provides valuable insights on the post COVID-19 impact on the market, which will help companies evaluate their business approaches. Furthermore, this report extensively covers e-beam wafer inspection system market segmentation by end user (IDM and foundry) and geography (APAC, North America, Europe, South America, and MEA). The e-beam wafer inspection system market report also offers information on several market vendors, including Applied Materials Inc., ASML Holding NV, Cognex Corp., Hitachi Ltd., JEOL Ltd., KLA Corp., Nanotronics, Newport Corp., Onto Innovation Inc., and Photo electron Soul Inc. among others.
Download the Free Report Sample to Unlock the E-Beam Wafer Inspection System Market Size for the Forecast Period and Other Important Statistics
Based on our research output, there has been a negative impact on the market growth during and post COVID-19 era. The increasing demand for semiconductor wafers is notably driving the e-beam wafer inspection system market growth, although factors such as difficulty in finding defects in an embedded chip may impede the market growth. Our research analysts have studied the historical data and deduced the key market drivers and the COVID-19 pandemic impact on the e-beam wafer inspection system industry. The holistic analysis of the drivers will help in deducing end goals and refining marketing strategies to gain a competitive edge.
Key E-Beam Wafer Inspection System Market Driver
Increasing demand for semiconductor wafers is a major driver fueling the e-beam wafer inspection system market growth. There has been an increase in the adoption of certain communication devices and consumer electronic equipment such as smartphones, tablets, wearables, LCDs, LEDs, and solid-state drives (SSD), owing to the demand for advanced and sophisticated electronic products from consumers worldwide. This has indirectly led to the high demand for superior quality semiconductors such as silicon-based wafers, which play a key role in ICs. Such ICs are an integral part of many electronic devices such as mobiles and computers. Similarly, new and emerging technologies such as the Internet of Things (IoT), machine-to-machine (M2M), ultra high definition (UHD) televisions, hybrid laptops, and vehicle automation are further driving the demand for semiconductor wafers. Therefore, as the demand for semiconductor wafers increases, the need for wafer inspection systems also increases in order to keep a check on the process and quality of the wafers. The increasing demand for semiconductor wafers will have a high impact on semiconductor foundries, as these foundries will invest in boosting their production capacity either by the expansion of the existing fabs or by developing new fabs.
Key E-Beam Wafer Inspection System Market Trend
Multi-beam e-beam inspection is a major trend influencing the e-beam wafer inspection system market growth. The e-beam wafer inspection system market is of two types, one being the traditional e-beam inspection and the other being the multi-beam e-beam inspection. To increase the throughputs of e-beam inspection systems, researchers are working to develop a multi-beam e-beam inspection system, which would make the throughputs faster than the traditional e-beam inspection system. These systems are expected to be launched during the forecast period and will take quite some time for mass production as these are still under development. For instance, in May 2020, ASML Holding NV (ASML) completed system integration and testing of its first-generation HMI multibeam inspection (MBI) system for 5 nm nodes and beyond. The HMI eScan 1000 demonstrated successful multibeam operation, simultaneously scanning nine beams on several test wafers. With nine beams, the eScan 1000 will increase throughput up to 600% compared to single e-beam inspection tools for targeted in-line defect inspection applications.
Key E-Beam Wafer Inspection System Market Challenge
The difficulty in finding defects in an embedded chip is a major hindrance to the e-beam wafer inspection system market growth. As the chips are embedded with a dynamic random-access memory (DRAM), static random-access memory (SRAM), and dense logic, it becomes difficult to find the defects. The chips are filled with minute materials, and it becomes hard to list out the part in which the defect is present. There is also some confusion regarding nuisance in the wafer and the actual defect of interest (DOI). A nuisance is a small irregularity in the wafer, which is not classified as a defect or impurity. In advanced nodes, the nuisances and DOIs are bunched together on a map and hence cannot be distinguished, which is a major challenge for the R&D teams of inspection system vendors. Hence, these challenges to identify defects on embedded chips can negatively affect the demand for e-beam wafer inspection systems for embedded chip applications and thereby hinder the potential growth of the market during the forecast period.
This e-beam wafer inspection system market analysis report also provides detailed information on other upcoming trends and challenges that will have a far-reaching effect on the market growth. The actionable insights on the trends and challenges will help companies evaluate and develop growth strategies for 2021-2025.
Technavio categorizes the global e-beam wafer inspection system market as a part of the global semiconductor equipment market. Our research report has extensively covered external factors influencing the parent market growth potential in the coming years, which will determine the levels of growth of the e-beam wafer inspection system market during the forecast period.
The report analyzes the market's competitive landscape and offers information on several market vendors, including:
This statistical study of the e-beam wafer inspection system market encompasses successful business strategies deployed by the key vendors. The e-beam wafer inspection system market is fragmented and the vendors are deploying organic and inorganic growth strategies to compete in the market.
To make the most of the opportunities and recover from post COVID-19 impact, market vendors should focus more on the growth prospects in the fast-growing segments, while maintaining their positions in the slow-growing segments.
The e-beam wafer inspection system market forecast report offers in-depth insights into key vendor profiles. The profiles include information on the production, sustainability, and prospects of the leading companies.
Our report provides extensive information on the value chain analysis for the e-beam wafer inspection system market, which vendors can leverage to gain a competitive advantage during the forecast period. The end-to-end understanding of the value chain is essential in profit margin optimization and evaluation of business strategies. The data available in our value chain analysis segment can help vendors drive costs and enhance customer services during the forecast period.
The value chain of global semiconductor equipment market includes the following core components:
The report has further elucidated other innovative approaches being followed by service providers to ensure a sustainable market presence.
1 Executive Summary
2 Market Landscape
3 Market Sizing
4 Five Forces Analysis
5 Market Segmentation by End-user
6 Customer landscape
7 Geographic Landscape
8 Drivers, Challenges, and Trends
9 Vendor Landscape
10 Vendor Analysis
11 Appendix
Get lifetime access to our
Technavio Insights
Quick Report Overview:
Cookie Policy
The Site uses cookies to record users' preferences in relation to the functionality of accessibility. We, our Affiliates, and our Vendors may store and access cookies on a device, and process personal data including unique identifiers sent by a device, to personalise content, tailor, and report on advertising and to analyse our traffic. By clicking “I’m fine with this”, you are allowing the use of these cookies. Please refer to the help guide of your browser for further information on cookies, including how to disable them. Review our Privacy & Cookie Notice.