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Optical patterned wafer inspection system is used to detect defects in patterned wafer during the wafer manufacturing process. This system consists of two technologies, such as bright-field inspection and dark-field inspection. The prevalent use of semiconductor wafer over a wide variety of industries, such as consumer electronics, automotive, and industrial segment is stimulating the global optical patterned wafer inspection equipment market, which has resulted in a projected CAGR of over 10% by 2019.
PART 01: Executive summary
PART 02: Scope of the report
PART 03: Market research methodology
PART 04: Introduction
PART 05: Technology landscape
PART 06: Market landscape
PART 07: Geographical segmentation
PART 08: Market drivers
PART 09: Impact of drivers
PART 10: Market challenges
PART 11: Impact of drivers and challenges
PART 12: Market trends
PART 13: Vendor landscape
PART 14: Key vendor analysis
PART 15: Key recommendations
PART 16: Appendix
PART 17: Explore Technavio
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