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About Thin-film Metrology Systems
Thin film metrology systems are used to measure the film thickness accurately. A series of film layers that act as a conductors, semiconductors, or bare wafers are deposited on an IC during IC fabrication. Thin film metrology systems are required during thin film deposition process to monitor and measure thin film parameters such as thickness, resistivity, and stress. There are various technologies used to measure the film thickness which include profilometry, ellipsometry, spectroscopic reflectrometry, and X-ray analysis.
TechNavio's analysts forecast the Global Thin-film Metrology Systems market will grow at a CAGR of 3.4 percent over the period 2014-2019.
Covered in this Report
This report covers the present scenario and growth prospects of the Global Thin Film Metrology Systems market for the period 2015-2019. It considers 2014 as the base year and provides data for the trailing 12 months. To calculate the market size, the report considers revenue generated from the sales of thin film metrology systems to various end-users including:
• ODMs
• OEMs
• Foundries
Key Regions
• Americas
• APAC
• EMEA
Key Vendors
• KLA-Tencor
• Nanometrics
• Nova Measuring Instruments
• Rudolph Technologies
Other Prominent Vendors
• Hitachi High-Technologies
• SCREEN Holdings
• Semilab
Key Market Driver
• Increased Level of Complexity in ICs
• For a full, detailed list, view our report
Key Market Challenge
• Cyclic Nature of Semiconductor Industry
• For a full, detailed list, view our report
Key Market Trend
• Increasing Demand for Integration and Miniaturization of Semiconductor Devices
• For a full, detailed list, view our report
Key Questions Answered in this Report
• What will the market size be in 2019 and what will the growth rate be?
• What are the key market trends?
• What is driving this market?
• What are the challenges to market growth?
• Who are the key vendors in this market space?
• What are the market opportunities and threats faced by the key vendors?
• What are the strengths and weaknesses of the key vendors?
01. Executive Summary
02. List of Abbreviations
03. Scope of the Report
03.1 Market Overview
03.2 Product Offerings
04. Market Research Methodology
04.1 Market Research Process
04.2 Research Methodology
05. Introduction
06. Market Landscape
06.1 Market Size and Forecast
06.2 Five Forces Analysis
07. Geographical Segmentation
07.1 Global Thin Film Metrology Systems Market by Geography
08. Buying Criteria
09. Market Growth Drivers
10. Drivers and their Impact
11. Market Challenges
12. Impact of Drivers and Challenges
13. Market Trends
14. Trends and their Impact
15. Vendor Landscape
15.1 Competitive Scenario
15.2 Market Share Analysis 2013
15.3 Other Prominent Vendors
15.3.1 SCREEN Holdings
15.3.2 Semilab
15.3.3 Hitachi High-Technologies
16. Key Vendor Analysis
16.1 KLA-Tencor
16.1.1 Key Facts
16.1.2 Business Overview
16.1.3 Product Segmentation
16.1.4 Services Offered
16.1.5 Geographical Segmentation by Revenue 2014
16.1.6 SWOT Analysis
16.2 Nanometrics
16.2.1 Key Facts
16.2.2 Business Overview
16.2.3 Business Segmentation by Revenue 2013
16.2.4 Business Segmentation by Revenue 2012 and 2013
16.2.5 Geographical Segmentation by Revenue 2013
16.2.6 Business Strategy
16.2.7 Recent Developments
16.2.8 SWOT Analysis
16.3 Nova Measuring Instruments
16.3.1 Key Facts
16.3.2 Business Overview
16.3.3 Product Segmentation
16.3.4 Geographical Segmentation by Revenue 2013
16.3.5 Business Strategy
16.3.6 Key Developments
16.3.7 SWOT Analysis
16.4 Rudolph Technologies
16.4.1 Key Facts
16.4.2 Business Overview
16.4.3 Business Segmentation by Revenue 2013
16.4.4 Business Segmentation by Revenue 2012 and 2013
16.4.5 Geographical Segmentation by Revenue 2013
16.4.6 Business Strategy
16.4.7 Recent Developments
16.4.8 SWOT Analysis
17. Other Reports in this Series
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